[ { ESSENTIALS OF ELECTRONIC TESTING FOR DIGITAL, MEMORY AND MIXED-SIGNAL VLSI CIRCUITS (2000. CORR. 2ND PRINTING 2004) (FRONTIERS IN ELECTRONIC TESTING #17) } ] by Bushnell, Michael J (AUTHOR) Nov-30-2000 [ Hardcover ]

by Michael L. Bushnell

Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means meeting the user's needs at a minimum cost.' The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip. The book consists Part Introduction, Test Process and ATE, Test Economics and Product Quality, Fault Modeling; Part Logic and Fault Simulation, Testability Measures, Combinatorial ATPG, Sequential ATPG, Memory Test, DSP-Based Analog Test, Model-Based Analog Test, Delay Test, IDDQ Test; Part DFT and Scan Design, BIST, Boundary Scan, Analog Test Bus, System Test and Core-Based Design, Future Testing; Cyclic Redundancy Code Theory, Primitive Polynomials, Books on Testing; over 700 entries.

Genres: Technical

Hardcover

First published January 1, 2000

Reviews

[Deepthi]

very usefull for doing project in testing