From the imaging and spectroscopy of individual dopant atoms and clusters buried inside a semiconductor host, to the three-dimensional tomography of nanoparticles, virii, and biological structures and the in situ observations of nano-mechanical deformation and electrodeposition, advances in instrumentation and algorithms have dramatically changed the field of electron microscopy. Early results in sub-angstrom resolution and millivolt spectroscopy are now being applied to materials problems, and initiatives in aberration-corrected instruments should make these available to the wider community. This book showcases how electron microscopy is applied to materials problems and to encourage ideas from both the solid-state and biological communities. Topics include: atomic and subatomic imaging and spectroscopy; electron energy-loss spectroscopy for sub-nanometer chemical and optical properties; three-dimensional nanoscale characterization; quantitative electron microscopy - holography, dopant profiling and diffraction; imaging individual structures and defects in bio- and nonomaterials and in situ microscopy of deformation and growth (even in liquids).