Atomic Force Microscopy

by Peter Eaton

Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique.

248 pages, Kindle Edition

First published January 1, 2010

About the author

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Peter Eaton was born in the UK in 1973. He has worked in Atomic Force Microscopy since 1998. He has used the technique in universities and research institutes in the UK, France, Portugal and Spain, and is the author of over 30 research articles. His first book, "Atomic Force Microscopy", covers the theory, methods, and applications of the technique in seven in-depth but easy-to-follow chapters with superb illustrations, and application examples from nanotechnology, materials science, chemistry, physics, life sciences and industry.