Circuit Design for Reliability

by Ricardo Reis (Editor), Cao Yu (Editor), Gilson Wirth (Editor)

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.  The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

278 pages, Paperback

First published November 16, 2010

About the author

Prof. Ricardo Augusto da Luz Reis, of the Universidade Federal do Rio Grande do Sul - UFRGS.