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Large Scale Integration Digital Testing: Annotated Bibliography, 1969-1978

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Excerpt from Large Scale Integration Digital Annotated Bibliography, 1969-1978

This annotated bibliography covers articles published in the field of semiconductor device testing. The bibliography contains (1) entries divided into six economics of testing, (2) monolithic circuit testing, (3) the testing of subsystems of large scale integrated circuits such as microcomputer boards and memory arrays, (4) various test strategies used to locate a defective lsi circuit, (5) test equipment available for lsi testing, and (6) various measurement methods that may be of interest to the test engineer.

Key Electronics; integrated circuit; large scale integration; memory; microprocessor; testing.

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This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.

54 pages, Paperback

Published March 19, 2018

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Thomas F Leedy

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