Electrothermal Analysis of VLSI Systems

by Yi-Kan Cheng, Ching-Han Tsai, Chin-Chi Teng

This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electrothermal temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.

233 pages, Kindle Edition

First published January 1, 2000