Achieving System Reliability Growth Through Robust Design and Test

by David Nicholls, Paul Lein, Thomas McGibbon

This book offers new definitions of how failures can be characterized, and how those new definitions can be used to develop metrics that will quantify how effective a Design for Reliability (DFR) process is in (1) identifying failure modes and (2) mitigating their root failure causes. Reliability growth can only occur in the presence of both elements.

460 pages, Paperback

Published January 1, 2011

About the author

Reverend David Gwyn Nicholls, DLitt (Oxon)

Librarian Note: There is more than one author by this name.

http://en.wikipedia.org/wiki/David_Ni...