Circuit Design for Reliability

by Ricardo Reis (Editor)

Introduction.- Recent Trends in Bias Temperature Instability.- Charge trapping phenomena in From Noise to Bias Temperature Instability.- Atomistic Simulations on Reliability.- On-chip characterization of statistical device degradation.- Circuit Resilience Roadmap.- Layout Aware Electromigration Analysis of Power/Ground Networks.- Power-Gating for Leakage Control and Beyond.- Soft Error Rate and Fault Tolerance Techniques for FPGAs.- Low Power Robust FinFET-based SRAM Design in Scaled Technologies.- Variability-Aware Clock Design.

280 pages, Paperback

First published November 16, 2010

About the author

Prof. Ricardo Augusto da Luz Reis, of the Universidade Federal do Rio Grande do Sul - UFRGS.