VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon

by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

808 pages, Hardcover

First published June 1, 2006