Sung-Mo Kang

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Sung-Mo Kang

Combine Editions
Sung-Mo Kang’s books

Average rating: 4.04 · 91 ratings · 6 reviews · 11 distinct works

	CMOS Digital Integrated Circuits Analysis & Design by Sung-Mo Kang, Yusuf Leblebici 4.12 avg rating — 90 ratings — published 1995 — 13 editions	Error rating book. Refresh and try again. Rate this book Clear rating 1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars
	CMOS Digital Integrated Circuits Analysis & Design: CMOS Digital Integrated Circuits Analysis & Design liked it 3.00 avg rating — 3 ratings	Error rating book. Refresh and try again. Rate this book Clear rating 1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars
	Cmos Digital Integrated Circuits: Analysis and Design by Sung-Mo Kang, Yusuf Leblebici really liked it 4.00 avg rating — 1 rating — published 2002	Error rating book. Refresh and try again. Rate this book Clear rating 1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars
	Modeling of Electrical Overstress in Integrated Circuits (The Springer International Series in Engineering and Computer Science) by Carlos H. Diaz, Sung-Mo Kang, Charvaka Duvvury really liked it 4.00 avg rating — 1 rating — published 1994 — 5 editions	Error rating book. Refresh and try again. Rate this book Clear rating 1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars
	Circuit Theory and Applications by Patrick Dewilde, Sung-Mo Kang it was ok 2.00 avg rating — 1 rating	Error rating book. Refresh and try again. Rate this book Clear rating 1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars
	Hot-Carrier Reliability of MOS VLSI Circuits (The Springer International Series in Engineering and Computer Science) by Yusuf Leblebici, Sung-Mo Kang it was ok 2.00 avg rating — 1 rating — published 1993 — 2 editions	Error rating book. Refresh and try again. Rate this book Clear rating 1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars
	CMOS Digital Integrated Circuits - Chinese Edition(Text in English) 0.00 avg rating — 0 ratings	Error rating book. Refresh and try again. Rate this book Clear rating 1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars
	VLSI Design for Reliability - Hot Electron 0.00 avg rating — 0 ratings	Error rating book. Refresh and try again. Rate this book Clear rating 1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars
	Prototype Rule-Based Reliability Analysis for VLSI Circuit Design 0.00 avg rating — 0 ratings	Error rating book. Refresh and try again. Rate this book Clear rating 1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars
	Computer-Aided Design of Optoelectronic Integrated Circuits and Systems by James J. Morikuni, Sung-Mo Kang 0.00 avg rating — 0 ratings — published 1997	Error rating book. Refresh and try again. Rate this book Clear rating 1 of 5 stars 2 of 5 stars 3 of 5 stars 4 of 5 stars 5 of 5 stars

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