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Infrared Ellipsometry on Semiconductor Layer Structures > Editions

by Mathias Schubert First published January 1st 2005

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Infrared Ellipsometry on Semiconductor Layer Structures
Infrared Ellipsometry on Semiconductor Layer Structures (Paperback)
Published March 16th 2009 by Springer
Paperback, 212 pages
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ISBN:
9783540804291 (ISBN10: 3540804293)
ASIN:
3540804293
Edition language:
English
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Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons (Springer Tracts in Modern Physics, 209)
Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons (Springer Tracts in Modern Physics, 209)
Published November 26th 2004 by Springer
2004, Hardcover, 207 pages
Author(s):
ISBN:
9783540232490 (ISBN10: 3540232494)
ASIN:
3540232494
Edition language:
English
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