Journey to Data Quality > Editions

by Leo L. Pipino First published October 1st 2006

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Journey to Data Quality
Published January 1st 2006 by Mit Pr
Hardcover, 226 pages
Author(s):
ISBN:
9780262122870 (ISBN10: 0262122871)
ASIN:
0262122871
Edition language:
English
Average rating:
3.62 (8 ratings)
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Journey to Data Quality
Published January 1st 2009 by Mit Pr
Reprint, Paperback, 226 pages
ISBN:
9780262513357 (ISBN10: 0262513358)
ASIN:
0262513358
Edition language:
English
Average rating:
3.00 (1 rating)
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Journey to Data Quality
Published August 21st 2009 by The MIT Press
Kindle Edition, 240 pages
Author(s):
ASIN:
B00ELW9NU6
Edition language:
English
Average rating:
0.0 (0 ratings)
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Journey to Data Quality [Paperback] [2009] (Author) Yang W. Lee, Leo L. Pipino, Richard Y. Wang, James D. Funk
Published by The MIT Press
Unknown Binding, 0 pages
Author(s):
ASIN:
B00G4HIZC8
Average rating:
0.0 (0 ratings)
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Journey to Data Quality by Lee Yang W. Pipino Leo L. Wang Richard Y. Funk James D. (2009-08-21) Paperback
Published by The MIT Press
Paperback, 0 pages
Author(s):
ASIN:
B012YSPOLA
Average rating:
0.0 (0 ratings)
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By Yang W. Lee Journey to Data Quality (Reprint) [Paperback]
Published by The MIT Press
Unknown Binding, 0 pages
Author(s):
ASIN:
B00RWRKO5K
Average rating:
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[(Journey to Data Quality )] [Author: Yang W. Lee] [Sep-2009]
Published by MIT Press
Unknown Binding, 0 pages
Author(s):
ASIN:
B0140ERZFO
Edition language:
English
Average rating:
0.0 (0 ratings)
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Journey to Data Quality by Lee, Yang W., Pipino, Leo L., Wang, Richard Y., Funk, James [The MIT Press, 2009] (Paperback) [Paperback]
Published by The MIT Press,2009
Paperback, 0 pages
Author(s):
ASIN:
B00MCA4UV6
Edition language:
English
Average rating:
0.0 (0 ratings)
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Journey to Data Quality (MIT Press) by Yang W. Lee Leo L. Pipino Richard Y. Wang James D. Funk(2009-08-21)
Published by The MIT Press
Paperback, 0 pages
Author(s):
ASIN:
B013F58XUU
Average rating:
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Journey to Data Quality by Lee Yang W. Pipino Leo L. Funk James D. Wang Richard Y. (2006-10-01) Hardcover
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