Helium Ion Microscopy > Editions

by David C. Joy First published September 13th 2013

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Helium Ion Microscopy: Principles and Applications (SpringerBriefs in Materials)

Published September 14th 2013 by Springer

2013, Paperback, 72 pages

Author(s):

ISBN:

9781461486596 (ISBN10: 1461486599)

ASIN:

1461486599

Edition language:

English

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Helium Ion Microscopy: Principles and Applications (SpringerBriefs in Materials)

Published September 13th 2013 by Springer

Kindle Edition, 73 pages

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ASIN:

B0DF5J8S76

Edition language:

English

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Helium Ion Microscopy: Principles and Applications (Paperback)

Published September 14th 2013 by Springer

Paperback, 74 pages

Author(s):

ISBN:

9781461486619 (ISBN10: 1461486610)

ASIN:

1461486610

Edition language:

English

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Helium Ion Microscopy: Principles and Applications (Springerbriefs in Materials)

Published May 14th 2014 by Not Avail

Paperback, 63 pages

Author(s):

ISBN:

9781461486602 (ISBN10: 1461486602)

ASIN:

1461486602

Edition language:

English

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Helium Ion Microscopy: Principles and Applications (SpringerBriefs in Materials)

Published September 13th 2013 by Springer

2013, Kindle Edition, 73 pages

Author(s):

ASIN:

B00F8HRZ80

Edition language:

English

Average rating:

0.0 (0 ratings)

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