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Long-Term Reliability of Nanometer VLSI Systems > Editions

by Sheldon Tan

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Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization
Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization (Kindle Edition)
Published September 12th 2019 by Springer
Kindle Edition, 807 pages
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ASIN:
B0DCBLXW7D
Edition language:
English
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Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization
Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization (Paperback)
Published September 25th 2020 by Springer
1st ed. 2019, Paperback, 501 pages
Author(s):
ISBN:
9783030261740 (ISBN10: 3030261743)
ASIN:
3030261743
Edition language:
English
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Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization
Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization (Paperback)
Published September 14th 2019 by Springer
Paperback, 504 pages
Author(s):
ISBN:
9783030261733 (ISBN10: 3030261735)
ASIN:
3030261735
Edition language:
English
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Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization
Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization (Hardcover)
Published October 20th 2019 by Springer
1st ed. 2019, Hardcover, 540 pages
Author(s):
ISBN:
9783030261719 (ISBN10: 3030261719)
ASIN:
3030261719
Edition language:
English
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Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization
Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization (Kindle Edition)
Published September 12th 2019 by Springer
1st ed. 2019, Kindle Edition, 807 pages
Author(s):
ISBN:
9783030261726 (ISBN10: 3030261727)
ASIN:
B07XLV9H92
Edition language:
English
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