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X-Ray Diffraction at Elevated Temperatures > Editions

by Deborah D.L. Chung

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X-ray diffraction at elevated temperatures: A method for in situ process analysis
X-ray diffraction at elevated temperatures: A method for in situ process analysis (Paperback)
Published January 1st 1993 by VCH
Paperback, 268 pages
Author(s):
ISBN:
9780895737458 (ISBN10: 0895737450)
ASIN:
0895737450
Edition language:
English
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X-Ray Diffraction at Elevated Temperatures
X-Ray Diffraction at Elevated Temperatures (Hardcover)
Published March 23rd 1993 by Wiley-VCH
Hardcover, 272 pages
Author(s):
ISBN:
9783527278428 (ISBN10: 3527278427)
ASIN:
3527278427
Edition language:
English
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