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VLSI Test Principles and Architectures > Editions

by Laung-Terng Wang First published June 1st 2006

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VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
Published July 21st 2006 by Morgan Kaufmann
1, Hardcover, 808 pages
Author(s):
ISBN:
9780123705976 (ISBN10: 0123705975)
ASIN:
0123705975
Edition language:
English
Average rating:
4.25 (8 ratings)
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VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
Published August 14th 2006 by Morgan Kaufmann
1, Kindle Edition, 808 pages
Author(s):
ASIN:
B004NYAS1U
Edition language:
English
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VLSI Test Principles and Architectures: Design for Testability
VLSI Test Principles and Architectures: Design for Testability (Kindle Edition)
Published August 14th 2006 by Morgan Kaufmann Publishers
Kindle Edition, 808 pages
Author(s):
ISBN:
9780080474793 (ISBN10: 0080474799)
ASIN:
0080474799
Edition language:
English
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VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series in Systems on Silicon) by Laung-Terng Wang (2006-07-21)
VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series in Systems on Silicon) by Laung-Terng Wang (2006-07-21)
Published by Morgan Kaufmann
Hardcover, 0 pages
Author(s):
ASIN:
B01F7XHJNA
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VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series in Systems on Silicon) Hardcover July 21, 2006
VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series in Systems on Silicon) Hardcover July 21, 2006
Published by morgan kaufmann; 1 edition (july 21, 2006)
Hardcover, 0 pages
Author(s):
ASIN:
B010TTLYQA
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VLSI Test Principles and Architectures: Design for Testability
VLSI Test Principles and Architectures: Design for Testability (Paperback)
Published July 21st 2006 by Morgan Kaufmann
1, Paperback, 808 pages
Author(s):
ISBN:
9781493300860 (ISBN10: 1493300865)
ASIN:
1493300865
Edition language:
English
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